To view the poster program please click here

Back to overview

Lecture

Overview of microstructural analysis methods for the characterization of damage in forming processes

Thursday (27.09.2018)
12:00 - 12:15 S1/03 - 283
Part of:


Forming of metals induces void evolution. Voids lead to a loss of bearing capacity, referred to as damage. Different methods of damage characterization such as the analysis of light optical micrographs, scanning electron microscopy and transmission electron microscopy are available. Each method has advantages with respect to the preferred scale of observation, resolution and sample preparation. A recent method, ion polishing provides the opportunity to observe voids in the nanometer range. However, the mentioned methods reveal only the defect structure. The link between defect structure and changes in the physical properties requires other methods. A recent concept for the determination of the local degraded Young’s modulus on the basis of resonance measurements is presented. The applicability of the investigated methods is highlighted for bulk-sheet metal forming.

Speaker:
Dr. Gregory Gerstein
Leibniz Universität Hannover
Additional Authors:
  • Florian Gutknecht
    TU Dortmund University
  • Dr. Till Clausmeyer
    TU Dortmund University
  • Dr. Florian Nürnberger
    Leibniz Universität Hannover