Synchrotron X-rays give outstanding possibilities for characterization of metal microstructures by mapping of crystallographic orientations non-destructively in 3D. However measurement time at large international synchrotron sources is typically limited and the spatial resolution may still a bit too poor for certain types of investigations. Therefore a combination of synchrotron X-ray and electron microscopy investigations often advantageous.
In this presentation, the combined use of these two types of techniques for investigations of annealing of deformed metals is highlighted. Both nucleation and migration of boundaries surrounding recrystallizing grains will be discussed based on recently obtained results. It is shown that the local microstructural variations in the deformed state are of utmost importance for the subsequent annealing processes and thus for the recrystallization microstructures. Conventional metals as well as 3D printed and multilayered samples are included. It is also discussed how the data may be used as input for MD, phase field and crystal plasticity finite element modelling as well as for model validation. The latter is in particular important, as full 4D validation of the models has not been possible until now because of lack of sufficient experimental data.
Due to the limited access to synchrotron sources, there is a need for laboratory facilities allowing non-destructive 3D characterization. Ideas for how to improve the spatial resolution and the sensitivity of the LabDCT technique shall be presented. It will be discussed how such an improved LabDCT method can contribute to the understanding of effects of the inherent microstructural variations and thus to the future design of metallic materials for high performance applications.