This symposium focuses on the joint use of electron microscopy (SEM / TEM) and atom probe tomography (APT) on the same specimen to unravel the three-dimensional nature of complex materials. The aim of the symposium is to bring together researchers with a background in electron microscopy and/or atom probe tomography to establish a common ground for future method and technique development. Besides scientific results, also practical aspects, such as improving specimen yield in the atom probe part of the experiment, or innovative experimental setups will be a topic. Techniques being newly developed or under development pushing the limits of 3D characterization that have high potential to be used in correlative TEM/APT applications are welcome. Contributions were a direct correlation of electron microscopy and atom probe tomography are successfully applied are preferred.
|Category||Short file description||File description||File Size|